Issue No. 08 - August (1984 vol. 33)
Balakrishnan Krishnamurthy , General Electric Research and Development Center, Schenectady, NY 12301.
Sheldon B. Akers , Military Electronic Systems Operation, General Electric Company, Syracuse, NY 13221.
Most NP-completeness results for test generation problems involve a reduction to the redundancy problem, which explicitly encodes the satisfiability problem. In this correspondence we investigate the complexity of a more modest problem¿that of estimating the size of a test set under the constraint that the circuit is irredundant. We show that even this constrained problem is NP-hard in the strong sense.
S. B. Akers and B. Krishnamurthy, "On the Complexity of Estimating the Size of a Test Set," in IEEE Transactions on Computers, vol. 33, no. , pp. 750-753, 1984.