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Issue No.08 - August (1984 vol.33)
pp: 750-753
Balakrishnan Krishnamurthy , General Electric Research and Development Center, Schenectady, NY 12301.
Sheldon B. Akers , Military Electronic Systems Operation, General Electric Company, Syracuse, NY 13221.
Most NP-completeness results for test generation problems involve a reduction to the redundancy problem, which explicitly encodes the satisfiability problem. In this correspondence we investigate the complexity of a more modest problem¿that of estimating the size of a test set under the constraint that the circuit is irredundant. We show that even this constrained problem is NP-hard in the strong sense.
Balakrishnan Krishnamurthy, Sheldon B. Akers, "On the Complexity of Estimating the Size of a Test Set", IEEE Transactions on Computers, vol.33, no. 8, pp. 750-753, August 1984, doi:10.1109/TC.1984.5009364
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