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TABLE OF CONTENTS
Issue No. 06 - June (vol. 33)
ISSN: 0018-9340
Papers

IEEE Computer Society (PDF)

pp. c2

Foreword?liable and Fault-Tolerant Computing (PDF)

J.P. Hayes , Dep. Elec. Eng. Comput. Sci. Univ. Michigan
pp. 465-466

On Random Pattern Test Length (Abstract)

J. Savir , IBM T.J. Watson Research Center
pp. 467-474

Functional Testing of Microprocessors (Abstract)

D. Brahme , Coordinated Science Laboratory, University of Illinois
pp. 475-485

An 0(n<sup>2.5</sup>) Fault Identification Algorithm for Diagnosable Systems (Abstract)

A.T. Dahbura , Department of Electrical Engineering and Computer Science, G. W. C. Whiting School of Engineering, The Johns Hopkins University
pp. 486-492

Design and Application of Self-Testing Comparators Implemented with MOS PLA's (PDF)

Y. Tamir , Computer Science Division, Department of Electrical Engineering and Computer Sciences, University of California
pp. 493-506

The Role of a Maintenance Processor for a General-Purpose Computer System (Abstract)

T.S. Liu , Honeywell Large Computer Products Division
pp. 507-517

Algorithm-Based Fault Tolerance for Matrix Operations (PDF)

null Kuang-Hua Huang , Engineering Research Center, AT&T Technologies, Inc.
pp. 518-528

Error Detection Process?Model, Design, and Its Impact on Computer Performance (Abstract)

K.G. Shin , Computing Research Laboratory, Department of Electrical and Computer Engineering, University of Michigan
pp. 529-540

Verification Testing?A Pseudoexhaustive Test Technique (PDF)

E.J. McCluskey , Center for Reliable Computing, Computer Systems Laboratory, Stanford University
pp. 541-546

Design of Totally Self-Checking Comparators with an Arbitrary Number of Inputs (Abstract)

J.L.A. Hughes , Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
pp. 546-550

The Design of Easily Testable VLSI Array Multipliers (Abstract)

J.P. Shen , SRC-CMU Center for Computer-Aided Design, Department of Electrical and Computer Engineering, Carnegie-Mellon University
pp. 554-560

Built-In Testing of One-Dimensional Unilateral Iterative Arrays (Abstract)

E.M. Aboulhamid , D?partement de Math?matiques et Informatique, Universit?du Qu?bec
pp. 560-564

A Study of Software Failures and Recovery in the MVS Operating System (PDF)

P. Velaardi , Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
pp. 564-568

Fault Tolerance in Binary Tree Architectures (Abstract)

C.S. Raghavendra , Department of Electrical Engineering-Systems, University of Southern California
pp. 568-572

Modified Berger Codes for Detection of Unidirectional Errors (Abstract)

null Hao Dong , Harbin Shipping Engineering Institute
pp. 572-575

Unidirectional Error Codes for Shift-Register Memories (PDF)

B. Bose , Department of Computer Science, Oregon State University
pp. 575-578

A Self-Testing Group-Parity Prediction Checker and Its Use for Built-In Testing (Abstract)

E. Fujiwara , Musashino Electrical Communication Laboratory, N.T.T.
pp. 578-583

PLA Implementation of k-out-of-n Code TSC Checker (Abstract)

B. Bose , Department of Computer Science, Oregon State University
pp. 583-588

Information for Authors (PDF)

pp. 588
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