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Issue No. 06 - June (1984 vol. 33)
ISSN: 0018-9340
pp: 560-564
E.M. Aboulhamid , D?partement de Math?matiques et Informatique, Universit?du Qu?bec
It has been shown in the literature that C-testable iterative arrays have very simple test structures, independent of the length of the arrays. We show in this work that all C-testable arrays are also pI-testable, which is a property yielding, in many cases, rather simple built-in-testing structures, both for the test generator and for the response verifier.
test generation, Built-in testing, C-testability, iterative logic arrays, testability

E. Cerny and E. Aboulhamid, "Built-In Testing of One-Dimensional Unilateral Iterative Arrays," in IEEE Transactions on Computers, vol. 33, no. , pp. 560-564, 1984.
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