Issue No. 06 - June (1984 vol. 33)
E.J. McCluskey , Center for Reliable Computing, Computer Systems Laboratory, Stanford University
A new approach to test pattern generation which is particularly suitable for self-test is described. Required computation time is much less than for present day automatic test pattern generation (ATPG) programs. Fault simulation or fault modeling is not required. More patterns may be obtained than from standard ATPG programs. However, fault coverage is much higher?all irredundant multiple as well as single stuck faults are detected. The test patterns are easily generated algorithmically either by program or hardware.
test pattern generation, Autonomous test, built-in self-test, pseudoexhaustive test
E. McCluskey, "Verification Testing?A Pseudoexhaustive Test Technique," in IEEE Transactions on Computers, vol. 33, no. , pp. 541-546, 1984.