Issue No. 06 - June (1984 vol. 33)
K.G. Shin , Computing Research Laboratory, Department of Electrical and Computer Engineering, University of Michigan
Conventionally, reliability analyses either assume that a fault/error is detected immediately as it occurs, or ignore damage caused by imperfect detection mechanisms and error latency, namely, the time interval between the occurrence of an error and the detection of that error.
unreliable results, Computation loss, diagnostics, error detection, latent errors/faults, recovery methods
n. Yann-Hang Lee and K. Shin, "Error Detection Process?Model, Design, and Its Impact on Computer Performance," in IEEE Transactions on Computers, vol. 33, no. , pp. 529-540, 1984.