Issue No. 06 - June (1984 vol. 33)
Y. Tamir , Computer Science Division, Department of Electrical Engineering and Computer Sciences, University of California
A high probability of detecting errors caused by hardware faults is an essential property of any fault-tolerant system. VLSI technology makes the use of duplication and matching for error detection practical and attractive. A critical circuit in this context is a self-testing comparator. Faults in the comparator must be detected so that they do not mask discrepancies between the duplicated modules.
two-rail code checker, Concurrent error detection, duplication and matching, faults in VLSI circuits, MOS PLA fault model, programmable logic array, self-testing comparator
C. Sequin and Y. Tamir, "Design and Application of Self-Testing Comparators Implemented with MOS PLA's," in IEEE Transactions on Computers, vol. 33, no. , pp. 493-506, 1984.