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Issue No. 10 - October (1983 vol. 32)
ISSN: 0018-9340
pp: 957-959
M.E. Aboulhamid , Department of Mathematics, Universit? du Qu?bec
Currently proposed and used schemes for built-in testing (B-I-T) use as test generators either binary counters (exhaustive testing), linear feedback shift registers (semiexhaustive testing), or ROM's containing the test vectors (prestored testing). The disadvantages of these methods have been discussed in [4], and a store-and-generate B-I-T arrangement was proposed as a compromise between the exhaustive and the prestored form of test generation. Unfortunately, no systematic method was given for producing tests.
test set compression, Anti-self-dual functions, built-in testing, coding, test generator
E. Cerny, M.E. Aboulhamid, "A Class of Test Generators for Built-In Testing", IEEE Transactions on Computers, vol. 32, no. , pp. 957-959, October 1983, doi:10.1109/TC.1983.1676141
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