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Issue No. 02 - February (1983 vol. 32)
ISSN: 0018-9340
pp: 190-194
Z. Barzilai , IBM T. J. Watson Research Center
ABSTRACT
One has a shift register of length n and a collection of designated subsets of {0, 1,???, n-1}. The problem is to devise a method for feeding a string of bits into the shift register in such an order that, for each designated subset S = {k<sup>1</sup>,???, k<sup>r</sup>}, if one keeps track of the bit patterns appearing at the corresponding positions k<sup>1</sup>, ???, k<sup>r</sup>of the shift r
INDEX TERMS
VLSI self-testing, Linear feedback shift registers (LFSR), primitive polynomials
CITATION
A.L. Rosenberg, D. Coppersmith, Z. Barzilai, "Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing", IEEE Transactions on Computers, vol. 32, no. , pp. 190-194, February 1983, doi:10.1109/TC.1983.1676202
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