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Issue No. 06 - June (1982 vol. 31)
ISSN: 0018-9340
pp: 560-564
W.F. Mikhail , IBM Corporation
ABSTRACT
This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations.
INDEX TERMS
single-error correction, Error-correcting codes, fault-tolerant systems, memory reliability, semiconductior memory
CITATION
W.F. Mikhail, R.A. Rutledge, R.W. Bartoldus, "The Reliability of Memory with Single-Error Correction", IEEE Transactions on Computers, vol. 31, no. , pp. 560-564, June 1982, doi:10.1109/TC.1982.1676042
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