Issue No. 06 - June (1982 vol. 31)
W.F. Mikhail , IBM Corporation
This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations.
single-error correction, Error-correcting codes, fault-tolerant systems, memory reliability, semiconductior memory
W. Mikhail, R. Rutledge and R. Bartoldus, "The Reliability of Memory with Single-Error Correction," in IEEE Transactions on Computers, vol. 31, no. , pp. 560-564, 1982.