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Issue No. 01 - January (1982 vol. 31)
ISSN: 0018-9340
pp: 2-15
T.W. Williams , General Technology Division, IBM
ABSTRACT
This paper discusses the basics of design for testability. A short review of testing is given along with some reasons why one should test. The different techniques of design for testability are discussed in detail. These include techniques which can be applied to today's technologies and techniques which have been recently introduced and will soon appear in new designs.
INDEX TERMS
testing, Built-In Logic Block Observation (BILBO), Level Sensitive Scan Design (LSSD), Random Access Scan, Scan Path, Scan/Set Logic, self test, Signature Analysis, test generation
CITATION
K.P. Parker, T.W. Williams, "Design for Testability - A Survey", IEEE Transactions on Computers, vol. 31, no. , pp. 2-15, January 1982, doi:10.1109/TC.1982.1675879
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