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Issue No. 12 - December (1981 vol. 30)
ISSN: 0018-9340
pp: 996-1000
Z. Barzilai , IBM Thomas J. Watson Research Center
ABSTRACT
With the advent of VLSI, testing has become one of the most costly, complicated, and time consuming problems. The method of syndrome- testing is applicable toward VLSI testing since it does not require test generation and fault simulation. It can also be considered as a vehicle for self-testing. In order to employ syndrome-testing in VLSI, we electronically partition the chip into macros in test mode. The macros are then syndrome tested in sequence.
INDEX TERMS
Syndrome-testing, Partitioning, self-testing, syndrome-testable design
CITATION
M.G. Smith, G. Markowsky, J. Savir, Z. Barzilai, "The Weighted Syndrome Sums Approach to VLSI Testing", IEEE Transactions on Computers, vol. 30, no. , pp. 996-1000, December 1981, doi:10.1109/TC.1981.1675744
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