The Community for Technology Leaders
Green Image
Issue No. 12 - December (1981 vol. 30)
ISSN: 0018-9340
pp: 987-988
T.W. Williams , General Technology Division, IBM
ABSTRACT
This correspondence presents a single equation relating the defect level of LSI chips to the yield and stuck-at-fault coverage with some assumptions. It is assumed that the faults occur randomly on the chips, which implies no clustering. This concept is extended to modules on boards.
INDEX TERMS
yield, Fault coverage, stuck-at-fault, testing
CITATION
N.C. Brown, T.W. Williams, "Defect Level as a Function of Fault Coverage", IEEE Transactions on Computers, vol. 30, no. , pp. 987-988, December 1981, doi:10.1109/TC.1981.1675742
100 ms
(Ver )