The Community for Technology Leaders
Green Image
Issue No. 11 - November (1981 vol. 30)
ISSN: 0018-9340
pp: 866-875
E.J. McCluskey , Center for Reliable Computing, Computer Systems Laboratory, Departments of Computer Science and Electrical Engineering, Stanford University
A technique for modifying networks so that they are capable of self test is presented. The major innovation is partitioning the network into subnetworks with sufficiently few inputs that exhaustive testing of the subnetworks is possible.
VLSI testing, Built-in test, CMOS testing, design for testability, exhaustive testing, partitioning, self-test, signature analysis, stuck- open faults, test pattern generation

E. McCluskey and S. Bozorgui-Nesbat, "Design for Autonomous Test," in IEEE Transactions on Computers, vol. 30, no. , pp. 866-875, 1981.
94 ms
(Ver 3.3 (11022016))