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Issue No.08 - August (vol.30)
ISSN: 0018-9340
G. Bongiovanni , IBM T. J. Watson Research Center
pp. 537-545
S. Thanawastien , Department of Electrical Engineering, Auburn University
pp. 545-556
H. Fujiwara , Faculty of Engineering, University of Waterloo
pp. 556-562
T. Sridhar , Department of Electrical Engineering, University of Southern California
pp. 563-571
I. Shirakawa , Departrment of Electronic Engineering, Osaka University
pp. 572-581
J.R. Armstrong , Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia
pp. 587-590
J.T. Butler , Department of Electrical Engineering and Computer Science, Northwestern University
pp. 590-596
A.B. Hayes , Department of Computer Science, University of Utah
pp. 596-600
Y.K. Malaiya , Research Group on Design Automation and Fault-Tolerant Computing, School of Advanced Technology, State University of New York
pp. 600-604
G. Markowsky , IBM T. J. Watson Research Center
pp. 604-606
J. Savir , IBM T. J. Watson Research Center
pp. 606-608
J.B. Surjaatmadja , Mechanical Research and Development Department, Halliburton Services
pp. 609-613
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