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Issue No. 08 - August (vol. 30)
ISSN: 0018-9340

IEEE Computer Society (PDF)

pp. c2

Tree Search in Major/Minor Loop Magnetic Bubble Memories (Abstract)

G. Bongiovanni , IBM T. J. Watson Research Center
pp. 537-545

Interference Analysis of Shuffle/Exchange Networks (Abstract)

S. Thanawastien , Department of Electrical Engineering, Auburn University
pp. 545-556

On Closedness and Test Complexity of Logic Circuits (Abstract)

H. Fujiwara , Faculty of Engineering, University of Waterloo
pp. 556-562

A Functional Approach to Testing Bit-Sliced Microprocessors (PDF)

T. Sridhar , Department of Electrical Engineering, University of Southern California
pp. 563-571

A Layout System for the Random Logic Portion of an MOS LSI Chip (Abstract)

I. Shirakawa , Departrment of Electronic Engineering, Osaka University
pp. 572-581

Fault Diagnosis in a Boolean n Cube Array of Microprocessors (Abstract)

J.R. Armstrong , Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia
pp. 587-590

Speed-Efficiency-Complexity Tradeoffs in Universal Diagnosis Algorithms (Abstract)

J.T. Butler , Department of Electrical Engineering and Computer Science, Northwestern University
pp. 590-596

Stored State Asynchronous Sequential Circuits (Abstract)

A.B. Hayes , Department of Computer Science, University of Utah
pp. 596-600

Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults (Abstract)

Y.K. Malaiya , Research Group on Design Automation and Fault-Tolerant Computing, School of Advanced Technology, State University of New York
pp. 600-604

Syndrome-Testability Can be Achieved by Circuit Modification (Abstract)

G. Markowsky , IBM T. J. Watson Research Center
pp. 604-606

Syndrome-Testing of " Syndrome-Untestable" Combinational Circuits (Abstract)

J. Savir , IBM T. J. Watson Research Center
pp. 606-608

An Algebra for Switching Circuits (Abstract)

J.B. Surjaatmadja , Mechanical Research and Development Department, Halliburton Services
pp. 609-613

Call for Papers (PDF)

pp. 613

Call for Papers (PDF)

pp. 613
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