Issue No. 08 - August (1981 vol. 30)
J. Savir , IBM T. J. Watson Research Center
In  and  a method of designing syndrome-testable combinational circuits was described. It was shown that, in general, syndrome-testable combinational circuits require some pin-penalty and maybe some logic for producing the testable design.
unate function, Inversion parity, reconvergent fan-out
J. Savir, "Syndrome-Testing of " Syndrome-Untestable" Combinational Circuits," in IEEE Transactions on Computers, vol. 30, no. , pp. 606-608, 1981.