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Issue No. 08 - August (1981 vol. 30)
ISSN: 0018-9340
pp: 587-590
J.R. Armstrong , Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia
Fault- tolerant characteristics of a Boolean n cube array of microprocessors are analyzed. Connectivity properties of the network graph are used to show that n processor or link failures are required to isolate a processor. For processor failures the network is shown to be n (one step) diagnosable. A testing algorithm is presented which can diagnose up to n processor failures.
network, Array, diagnosability, faults, fault tolerance, microprocessor

J. Armstrong and F. Gray, "Fault Diagnosis in a Boolean n Cube Array of Microprocessors," in IEEE Transactions on Computers, vol. 30, no. , pp. 587-590, 1981.
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