Issue No.08 - August (1981 vol.30)
J.R. Armstrong , Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia
Fault- tolerant characteristics of a Boolean n cube array of microprocessors are analyzed. Connectivity properties of the network graph are used to show that n processor or link failures are required to isolate a processor. For processor failures the network is shown to be n (one step) diagnosable. A testing algorithm is presented which can diagnose up to n processor failures.
network, Array, diagnosability, faults, fault tolerance, microprocessor
J.R. Armstrong, F.G. Gray, "Fault Diagnosis in a Boolean n Cube Array of Microprocessors", IEEE Transactions on Computers, vol.30, no. 8, pp. 587-590, August 1981, doi:10.1109/TC.1981.1675844