Issue No. 08 - August (1981 vol. 30)
J.R. Armstrong , Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia
Fault- tolerant characteristics of a Boolean n cube array of microprocessors are analyzed. Connectivity properties of the network graph are used to show that n processor or link failures are required to isolate a processor. For processor failures the network is shown to be n (one step) diagnosable. A testing algorithm is presented which can diagnose up to n processor failures.
network, Array, diagnosability, faults, fault tolerance, microprocessor
J. Armstrong and F. Gray, "Fault Diagnosis in a Boolean n Cube Array of Microprocessors," in IEEE Transactions on Computers, vol. 30, no. , pp. 587-590, 1981.