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Issue No. 05 - May (1981 vol. 30)
ISSN: 0018-9340
pp: 356-358
null Se June Hong , IBM T. J. Watson Research Center
A simple procedure to produce a minimum length test set for a parity network is presented. If M is the largest fan in of any EX-OR gate element in the tree, 2M test patterns are chosen by considering only 2M test sequences, of length 2M, assigned to each signal line.
parity tree, EX-OR gate, optimum testing

n. Se June Hong and D. Ostapko, "A Simple Procedure to Generate Optimum Test Patterns for Parity Logic Networks," in IEEE Transactions on Computers, vol. 30, no. , pp. 356-358, 1981.
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