Issue No. 07 - July (1980 vol. 29)
J. Savir , IBM Thomas J. Watson Research Center
Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.
state table, Error latency, deterministic and random testing, input probability, intermittent fault, Markov chain, sequential circuit
J. Savir, "Detection of Single Intermittent Faults in Sequential Circuits," in IEEE Transactions on Computers, vol. 29, no. , pp. 673-678, 1980.