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Issue No. 07 - July (1980 vol. 29)
ISSN: 0018-9340
pp: 668-673
R. David , Laboratoire d'Automatique de Grenoble, Institut National Polytechnique de Grenoble
A compact testing method called feedback shift register testing (FSR testing) is presented and its properties, concerning detection and diagnosis, are given. The new notion of distinction potential is introduced. The proposed method is shown to have the maximum resolution and the maximum distinction potential that can be found for an m-bit signature.
fault distinction, Compact testing, distinction potential, feedback shift register, FSR testing, resolution, fault detection

R. David, "Testing by Feedback Shift Register," in IEEE Transactions on Computers, vol. 29, no. , pp. 668-673, 1980.
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