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Issue No. 06 - June (vol. 29)
ISSN: 0018-9340

IEEE Computer Society (PDF)

pp. c2

Fault-Tolerant Computing: An Introduction (PDF)

J.J. Stiffler , Raytheon Company
pp. 417-419

Test Generation for Microprocessors (Abstract)

S.M. Thatte , Central Research Laboratories, Texas Instruments Incorporated
pp. 429-441

Syndrome-Testable Design of Combinational Circuits (Abstract)

J. Savir , IBM Thomas J. Watson Research Center
pp. 442-451

Diagnosis Without Repair for Hybrid Fault Situations (Abstract)

S. Mallela , Western Electric Engineering Research Center
pp. 461-470

Performability Evaluation of the SIFT Computer (Abstract)

J.F. Meyer , Department of Electrical and Computer Engineering (Program in Computer, Information, and Control Engineering) and the Department of Computer and Communication Sciences, University of Michigan
pp. 501-509

Measures of the Effectiveness of Fault Signature Analysis (Abstract)

J.E. Smith , University of Wisconsin-Madison
pp. 510-514

Minimal Detecting Transition Sequences: Application to Random Testing (Abstract)

R. David , Laboratoire d'Automatique, Institut National Polytechnique de Grenoble
pp. 514-518

Multiple Fault Detection in Programmable Logic Arrays (Abstract)

V.K. Agarwal , Department of Electrical Engineering, McGill University
pp. 518-522

Detection and Location of Input and Feedback Bridging Faults Among Input and Output Lines (Abstract)

M. Karpovsky , Department of Computer Science, School of Advanced Technology, State University of New York
pp. 523-527

Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability (Abstract)

J. Galiay , Soci?t? pour l'Etude et la Fabrication de Circuits Int?gr?s Sp?ciaux (EFCIS)
pp. 527-531

Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor (Abstract)

Y. Crouzet , Laboratoire d'Automatique et d'Analyse des Systemes du CNRS
pp. 532-537

Multivalued I<sup>2</sup>L Circuits for TSC Checkers (PDF)

D. Etiemble , Institut de Programmation, Universite Pierre et Marie Curie
pp. 537-540

A Recovery Cache for the PDP-11 (Abstract)

P.A. Lee , Computing Laboratory, University of Newcastle- upon-Tyne
pp. 546-549

Call for Papers (PDF)

pp. 549
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