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Issue No. 06 - June (1980 vol. 29)
ISSN: 0018-9340
pp: 537-540
D. Etiemble , Institut de Programmation, Universite Pierre et Marie Curie
We present a TSC multivalued I2L comparator which uses multivalued current inputs and two binary voltage outputs. This circuit is self-testing and fault-secure for single faults (either "stuck-at" or "skew" faults). It is the basic circuit to realize TSC checkers for nonseparable or separable codes. The schemes are simpler than the designs of the TSC combinational checkers.
totally self-checking comparator, Error-detecting codes, I, multivalued logic, totally self-checking checkers

D. Etiemble, "Multivalued I<sup>2</sup>L Circuits for TSC Checkers," in IEEE Transactions on Computers, vol. 29, no. , pp. 537-540, 1980.
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