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Issue No. 06 - June (1980 vol. 29)
ISSN: 0018-9340
pp: 532-537
Y. Crouzet , Laboratoire d'Automatique et d'Analyse des Systemes du CNRS
Self-checking approaches developed so far deal with a gate level representation of logical circuits. They do not account for constraints which may result from an implementation by integrated circuits. This paper is concerned with such practical problems and their respective significance.
self-checking LSI circuits, Coding, fault detection, self-checking

Y. Crouzet and C. Landrault, "Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor," in IEEE Transactions on Computers, vol. 29, no. , pp. 532-537, 1980.
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