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Issue No. 06 - June (1980 vol. 29)
ISSN: 0018-9340
pp: 442-451
J. Savir , IBM Thomas J. Watson Research Center
Classical testing of combinational circuits requires a list of the fault-free response of the circuit to the test set. For most practical circuits implemented today the large storage requirement for such a list makes such a test procedure very expensive. Moreover, the computational cost to generate the test set increases exponentially with the circuit size.
stuck-at fault, Combinational circuit, fan-out-free circuit, minterm, prime implicant, single fault

J. Savir, "Syndrome-Testable Design of Combinational Circuits," in IEEE Transactions on Computers, vol. 29, no. , pp. 442-451, 1980.
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