Issue No. 06 - June (1980 vol. 29)
D.S. Suk , Bell Laboratories
A class of pattern-sensitive faults in semiconductor random-access memories are studied. Efficient test procedures to detect and locate modeled faults are presented.
semiconductor random- access memories, Pattern-sensitive faults
D. Suk and S. Reddy, "Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories," in IEEE Transactions on Computers, vol. 29, no. , pp. 419-429, 1980.