The Community for Technology Leaders
Green Image
ABSTRACT
A class of pattern-sensitive faults in semiconductor random-access memories are studied. Efficient test procedures to detect and locate modeled faults are presented.
INDEX TERMS
semiconductor random- access memories, Pattern-sensitive faults
CITATION

D. Suk and S. Reddy, "Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories," in IEEE Transactions on Computers, vol. 29, no. , pp. 419-429, 1980.
doi:10.1109/TC.1980.1675601
97 ms
(Ver 3.3 (11022016))