The Community for Technology Leaders
Green Image
TABLE OF CONTENTS
Issue No. 03 - March (vol. 29)
ISSN: 0018-9340
Papers

IEEE Computer Society (PDF)

pp. c2

Notes on Shuffle/Exchange-Type Switching Networks (Abstract)

D.S., Jr. Parker , Department of Computer Science, University of California
pp. 213-222

Functional Level Primitives in Test Generation (Abstract)

M.A. Breuer , Department of Electrical Engineering and Department of Computer Science, University of Southern California
pp. 223-235

An Experimental Delay Test Generator for LSI Logic (Abstract)

J.D. Lesser , IBM Thomas J. Watson Research Center
pp. 235-248

Testing Memories for Single-Cell Pattern-Sensitive Faults (Abstract)

J.P. Hayes , Departments of Electrical Engineering and Computer Science, University of Southern California
pp. 249-254

A Hardware Redundancy Reconfiguration Scheme for Tolerating Multiple Module Failures (Abstract)

S.Y.H. Su , Department of Computer Science, School of Advanced Technology, State University of New York
pp. 254-258

A Digital Quarter Square Multiplier (PDF)

E.L. Johnson , Department of Electrical Engineering, Wichita State University
pp. 258-261

A New Approach to the Evaluation of the Reliability of Digital Systems (Abstract)

I. Koren , Department of Electrical Engineering, Technion-Israel Institute of Technology
pp. 261-267

Call for Papers (PDF)

pp. 267

Call for Papers (PDF)

pp. 267
88 ms
(Ver 3.1 (10032016))