The Community for Technology Leaders
Green Image
Issue No. 11 - November (1979 vol. 28)
ISSN: 0018-9340
pp: 863-864
G. Markowsky , Department of Computer Sciences, IBM T. J. Watson Research Center
We show how to construct, in a simple manner, a test set having n + 1 tests for a fanout-free combinational circuit with n primary inputs which distinguishes (diagnoses) nonequivalent single faults. This result is an improvement over the upper bound in [1, Theorem 3.9] of n + g (g is the number of primary input gates) and the upper bound in [3, Theorem 4], [5] of 2n for the least number of tests required to distinguish among nonequivalent single faults.
test set, Algorithm, diagnosing single faults, fanout-free combinatorial circuits, stuck line fault

G. Markowsky, "Diagnosing Single Faults in Fanout-Free Combinational Circuits," in IEEE Transactions on Computers, vol. 28, no. , pp. 863-864, 1979.
93 ms
(Ver 3.3 (11022016))