Issue No. 08 - August (1979 vol. 28)
V.D. Agrawal , Bell Laboratories
P. B. Schneck is right in pointing out that maximum fan-in will lead to a more conservative estimate of the number of random patterns needed for complete testing. It is, however, useful to compare these estimates with practical cases. We will consider two examples.
V. Agrawal, "Author's Reply," in IEEE Transactions on Computers, vol. 28, no. , pp. 581, 1979.