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Issue No. 08 - August (1979 vol. 28)
ISSN: 0018-9340
pp: 580-581
P.B. Schneck , Goddard Space Flight Center
ABSTRACT
This correspondence indicates a weakness in forming the criteria used to decide when random testing is practical. The use of average fan-in based on total gate count is an oversimplification and results in too low a threshold for use of random testing in lieu of a complete test of 2N patterns. A modification is given to avoid this difficulty.
INDEX TERMS
primary inputs, Fan-in
CITATION
P.B. Schneck, "Comment on "When to Use Random Testing"", IEEE Transactions on Computers, vol. 28, no. , pp. 580-581, August 1979, doi:10.1109/TC.1979.1675415
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