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Issue No. 05 - May (1979 vol. 28)
ISSN: 0018-9340
pp: 367-371
W. Coy , Abteilung Informatik, Universit?t of Dortmund
A design procedure is shown which allows the construction of one-dimensional iterative systems of combinational cells with good single stuck-at fault test complexity. Let S be a system where one of the M input words and two of the N states are defined for test purposes and the cells are realized as AND?EXOR normal form circuits, then S is testable with at most [log<inf>2</inf>(M x N) + 6] tests fo
stuck-at faults., Combinational cells, iterative systems

W. Coy, "On the Design of Easily Testable Iterative Systems of Combinational Cells," in IEEE Transactions on Computers, vol. 28, no. , pp. 367-371, 1979.
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