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Issue No. 04 - April (1979 vol. 28)
ISSN: 0018-9340
pp: 319-325
C. Turcat , CEPHAG, Equipe de Recherche Associ?e du C.N.R.S.
This paper shows how network symmetries (or the graph-theory concept of automorphism) can be used to cluster faults into classes and thus simplify the process of finding a test set: tests for these automorphic classes are found by classical methods and then expanded using automorphisms to produce a test-set. The process does not seem more complex than the classical ones. Furthermore, by using a multilevel description, the process is easily extended to networks of modules.
test., Automorphism, faults, symmetry
C. Turcat, A. Verdillon, "Symmetry, Automorphism, and Test", IEEE Transactions on Computers, vol. 28, no. , pp. 319-325, April 1979, doi:10.1109/TC.1979.1675354
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