Issue No. 01 - January (1979 vol. 28)
J.J. Shedletsky , IBM Thomas J. Watson Research Center
A recurring problem in the analysis of random testing is the tradeoff between accuracy and computational efficienlcy. Every random test requires an (implicit or explicit) analysis of the relaretionship between test confidence and test length for thle circuit under test. This analysis is used to specify a test length. The error latency model ELM  provides an accurate analysis of fault behavior in sequential circuits, but the accuracy obtained is computationally costly. On the other hand, an analysis that sacrifices too much accuracy for computational efficiency would be inadequate for controlling test confidence. The important question is if an analysis can be computationally practical, yet accurate enough to maintain product quality levels .
E. McCluskey and J. Shedletsky, "Authors' Reply<sup>2</sup>," in IEEE Transactions on Computers, vol. 28, no. , pp. 86, 1979.