Issue No. 01 - January (1979 vol. 28)
R. David , Laboratoire d'Automatique, INP Grenoble
In the paper "The Error Latency of a Fault in a Sequential Digital Circuit," the method presented in  to evaluate the random test length to be applied to a sequential circuit, is called the "approximation method." We agree with this name, but wish to offer the following interpretations and clarifications (using the notations of Shedletsky and McCluskey<sup>1</sup>).
R. David and R. Tellez-Giron, "Comments on "The Error Latency of a Fault in a Sequential Digital Circuit"," in IEEE Transactions on Computers, vol. 28, no. , pp. 85-86, 1979.