Issue No. 11 - November (1978 vol. 27)
V.D. Agrawal , Bell Laboratories
A probabilistic method for deciding whether a combinational circuit should be tested by random inputs, is given. This decision is based upon certain easily observable circuit parameters, such as, the number of primary inputs, the number of levels, and the average fan in.
test generation, Diagnosis, fault detection, random testing
V. Agrawal, "When to Use Random Testing," in IEEE Transactions on Computers, vol. 27, no. , pp. 1054-1055, 1978.