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Issue No. 11 - November (1978 vol. 27)
ISSN: 0018-9340
pp: 1054-1055
V.D. Agrawal , Bell Laboratories
ABSTRACT
A probabilistic method for deciding whether a combinational circuit should be tested by random inputs, is given. This decision is based upon certain easily observable circuit parameters, such as, the number of primary inputs, the number of levels, and the average fan in.
INDEX TERMS
test generation, Diagnosis, fault detection, random testing
CITATION
V.D. Agrawal, "When to Use Random Testing", IEEE Transactions on Computers, vol. 27, no. , pp. 1054-1055, November 1978, doi:10.1109/TC.1978.1674994
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