Issue No. 11 - November (1977 vol. 26)
J., Jr. Knaizuk , Department of Computer Science, State University College
This correspondence presents an optimal algorithm to detect any single "stuck-at-i," "stuck-at-O" fault and any combination of "stuck-at-I," "stuck-at-O" multiple faults in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2n memory accesses.
Fault detection stuck-at aults, optimal algorithm, random access memories.
C. Hartmann and J. J. Knaizuk, "An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories," in IEEE Transactions on Computers, vol. 26, no. , pp. 1141-1144, 1977.