The Community for Technology Leaders
Green Image
Issue No. 04 - April (1977 vol. 26)
ISSN: 0018-9340
pp: 414-416
J., Jr. Knaizuk , Department of Computer Science, State University College
This correspondence presents an optimal algorithm to detect any single stuck-at-1 (s-a-1), stuck-at-0 (s-a-0) fault in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2<sup>n</sup>memory accesses.
Fault detection, optimal algorithm, random access memory, single stuck-at-fault.

C. Hartmann and J. J. Knaizuk, "An Algorithm for Testing Random Access Memories," in IEEE Transactions on Computers, vol. 26, no. , pp. 414-416, 1977.
92 ms
(Ver 3.3 (11022016))