Issue No. 03 - March (1977 vol. 26)
S.M. Reddy , Division of Information Engineering, University of Iowa
Test sets to detect single and multiple stuck-at faults in combinational networks by transition counting are given.
Single and multiple faults, transition count testing.
S. Reddy, "A Note on Testing Logic Circuits by Transition Counting," in IEEE Transactions on Computers, vol. 26, no. , pp. 313-314, 1977.