The Community for Technology Leaders
Green Image
Issue No. 07 - July (1976 vol. 25)
ISSN: 0018-9340
pp: 725-736
R.W. Ehrich , Department of Electrical and Computer Engineering, University of Massachusetts
ABSTRACT
In a number of applications of image processing, much information about objects or textures in the image can be obtained by sequential analysis of individual scan lines.
INDEX TERMS
Peak, scan line, stack, texture, tree, valley.
CITATION
R.W. Ehrich, J.P. Foith, "Representation of Random Waveforms by Relational Trees", IEEE Transactions on Computers, vol. 25, no. , pp. 725-736, July 1976, doi:10.1109/TC.1976.1674681
125 ms
(Ver )