Issue No. 06 - June (1976 vol. 25)
P. Agrawal , Department of Electrical Engineering, University of Southern California
It is shown that by a proper selection of the probabilities of 0 and 1 at the inputs, the efficiency of random test generation can be improved. This correspondence includes some results describing the testing of actual logic networks used in a computer.
Combinational tree networks, detection probability, fault detection, logic testing, random test generation.
P. Agrawal and V. Agrawal, "On Monte Carlo Testing of Logic Tree Networks," in IEEE Transactions on Computers, vol. 25, no. , pp. 664-667, 1976.