Issue No. 10 - October (1975 vol. 24)
S.C. Hu , Department of Electrical Engineering, Cleveland State University
Logic gates subject to asymmetric input faults may be made more reliable by employing redundant inputs. A mathematical expression for determining the optimum number of redundant inputs based on input reliabilities of the gate is developed. The development follows the theory of combinatorial probability.
Asymmetric input-faults, input redundancy, logic gate, probability, reliability.
S. Hu, "A Probabilistic Approach of Designing More Reliable Logic Gates with Asymmetric Input Faults," in IEEE Transactions on Computers, vol. 24, no. , pp. 1012-1014, 1975.