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Issue No. 07 - July (1975 vol. 24)
ISSN: 0018-9340
pp: 746-750
D.T. Wang , System Products Division, IBM Corporation
This correspondence discusses the properties of faults in combinational networks and their relationships with fault-detection and fault-location test sets.
Criticality of values under test, fault equivalence, fault detection, fault dominance, fault location, fault masking, test generation.
D.T. Wang, "Properties of Faults and Criticalities of Values under Tests for Combinational Networks", IEEE Transactions on Computers, vol. 24, no. , pp. 746-750, July 1975, doi:10.1109/T-C.1975.224296
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