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Issue No. 05 - May (vol. 24)
ISSN: 0018-9340

IEEE Computer Society (PDF)

pp. c2

Fault-Tolerant Computing: An Introduction and a Perspective (Abstract)

C.R. Kime , Department of Electrical and Computer Engineering, University of Wisconsin
pp. 457-460

An Approach to the Diagnosis of Intermittent Faults (Abstract)

S. Kamal , Computer Science Section, Department of Mathematics, Wayne State University
pp. 461-467

On-Line Diagnosis of Unrestricted Faults (Abstract)

J.F. Meyer , Department of Computer and Communication Sciences and the Department of Electrical and Computer Engineering (Program in Computer, Information, and Control Engineering), University of Michigan
pp. 468-475

Fault Masking in Combinational Logic Circuits (Abstract)

F.J.O. Dias , Digital Systems Laboratory, Stanford University
pp. 476-482

A Totally Self-Checking Checker Design for the Detection of Errors in Periodic Signals (PDF)

A.M. Usas , Digital Systems Laboratory, Stanford University
pp. 483-489

An Advanced Fault Isolation System for Digital Logic (PDF)

N. Benowitz , Data Systems Division, Hughes Aircraft Company
pp. 489-497

The Architectural Elements of a Symmetric Fault-Tolerant Multiprocessor (Abstract)

A.L. Hopkins , Department of Aeronautics and Astronautics, Massachusetts Institute of Technology
pp. 498-505

A Damage- and Fault-Tolerant Input/Output Network (Abstract)

T.B. Smith , C. S. Draper Laboratory
pp. 505-512

Reliability Modeling of Compensating Module Failures in Majority Voted Redundancy (PDF)

D.P. Siewiorek , Department of Computer Science and the Department of Electrical Engineering, Carnegie-Mellon University
pp. 525-533

The Probability of a Correct Output from a Combinational Circuit (Abstract)

R.C. Ogus , Digital Systems Laboratory, Stanford University
pp. 534-544

Some Problems in Certifying Microprograms (PDF)

G.B. Leeman , Department of Computer Science, IBM Thomas J. Watson Research Center
pp. 545-553

Methodology for the Generation of Program Test Data (PDF)

W.E. Howden , Computer Science Division, Department of Applied Physics and Information Science, University of California
pp. 554-560

A Method for Obtaining SPOOF's (Abstract)

null Siu-Chong Si , Department of Electrical Engineering, Lehigh University
pp. 560-562

Design of Reliable Synchronous Sequential Circuits (Abstract)

D.H. Sawin , Communication/Automatic Data Processing Laboratory, U. S. Army Electronics Command
pp. 567-570

Transient Failures in Triple Modular Redundancy Systems with Sequential Modules (Abstract)

J.F. Wakerly , Digital Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
pp. 570-573

Analysis of Logic Circuits with Faults Using Input Signal Probabilities (Abstract)

K.P. Parker , Digital Systems Laboratory, Stanford University
pp. 573-578

A Combinatorial Solution to the Reliability of Interwoven Redundant Logic Networks (PDF)

J.A. Abraham , Digital Systems Laboratory, Stanford University
pp. 578-584
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