Issue No. 11 - November (1974 vol. 23)
Y. Tohma , Department of Electronics, Tokyo Institute of Technology
A method for the realization of fail-safe sequential circuits is presented where flip-flops are employed for representing the internal states. First, such a design technique where the circuit will be trapped in an erroneous state into which it is transferred by a fault is shown. Further, the condition for assuring that the circuit will be dropped into the particular (predetermined) final state when a fault exists is described. Finally, some extensions of the technique are attempted.
Fail-safe, fault, flip-flop, reliable system, sequential circuit.
Y. Tohma, "Design Technique of Fail-Safe Sequential Circuits Using Flip-Flops For Internal Memory," in IEEE Transactions on Computers, vol. 23, no. , pp. 1149-1154, 1974.