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TABLE OF CONTENTS
Issue No. 07 - July (vol. 23)
ISSN: 0018-9340
Papers

IEEE Computer Society (PDF)

pp. c2

Fault-Tolerant Computing: An Introduction (Abstract)

D.R. Schertz , Department of Electrical Engineering and Electrical Engineering Technology, Bradley University
pp. 649-650

Fault-Tolerant Asynchronous Sequential Machines (PDF)

G.K. Maki , Electrical Engineering Department, University of Idaho
pp. 651-657

Partially Self-Checking Circuits and Their Use in Performing Logical Operations (Abstract)

J.F. Wakerly , Digital Systems Laboratory, Stanford University
pp. 658-666

Fault-Tolerance of the Iterative Cell Array Switch for Hybrid Redundancy (PDF)

R.C. Ogus , Digital Systems Laboratory, Stanford University
pp. 667-681

An Organization for a Highly Survivable Memory (Abstract)

J. Goldberg , Computer Science Group, Stanford Research Institute
pp. 693-705

Fault Diagnosis as a Graph Coloring Problem (Abstract)

S.B. Akers , Electronics Laboratory, General Electric Company
pp. 706-713

Intermittent Faults: A Model and a Detection Procedure (Abstract)

S. Kamal , Computer Science Section, Department of Mathematics, Wayne State University
pp. 713-719

Bridging and Stuck-At Faults (Abstract)

K.C.Y. Mei , Data Systems Division, Hewlett-Packard
pp. 720-727

Test Point Placement to Simplify Fault Detection (Abstract)

J.P. Hayes , Department of Electrical Engineering and Computer Science Program, University of Southern California
pp. 727-735

A Method for the Realization of Fail-Safe Asynchronous Sequential Circuits (Abstract)

Y. Mukai , Department of Electronics, Tokyo Institute of Technology
pp. 736-739

An Examination of Algebraic Test Generation Methods for Multiple Faults (Abstract)

B.D. Carroll , Department of Electrical Engineering, Auburn University
pp. 743-745

Diagnosis of Short-Circuit Faults in Combinational Circuits (Abstract)

A.D. Friedman , Department of Electrical Engineering and Computer Science, University of Southern California
pp. 746-752
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