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Issue No. 02 - February (1974 vol. 23)
ISSN: 0018-9340
pp: 194-199
J.T. Chu , Department of Industrial Engineering and Operations Research, New York University
For the average error probability Pe associated with the Bayes recognition procedures for two possible patterns, using no context, new upper and lower bounds and approximations are obtained. Results are given in terms of simple functions of feature "reliability" and a priori probabilities of the patterns. Two kinds of feature "reliability" are considered, i.e., distance between probability distrib
Character recognition, decision procedures, error probability, feature selection, pattern recognition, upper and lower bounds, and approximations.

J. Chu, "Some New Error Bounds and Approximations for Pattern Recognition," in IEEE Transactions on Computers, vol. 23, no. , pp. 194-199, 1974.
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