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Issue No. 03 - March (1973 vol. 22)
ISSN: 0018-9340
pp: 235-240
null Min-Wen Du , College of Engineering, National Chiao Tung University
A new approach is developed for finding multiple fault detection tests under quite arbitrary fault models. Computational results are reported and discussed.
Combinational logic networks, computational experiments, fault detection, fault tree, function verification, multiple faults.
null Min-Wen Du, C.D. Weiss, "Multiple Fault Detection in Combinational Circuits: Algorithms and Computational Results", IEEE Transactions on Computers, vol. 22, no. , pp. 235-240, March 1973, doi:10.1109/T-C.1973.223700
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