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TABLE OF CONTENTS
Issue No. 04 - April (vol. 21)
ISSN: 0018-9340
Papers

[Front cover] (PDF)

pp. c1

IEEE Computer Society (PDF)

pp. nil1

Breaker Page (PDF)

pp. nil1

Pseudonoise with Arbitrary Amplitude Distribution¿Part I: Theory (Abstract)

John S. Sobolewski , Departments of Electrical Engineering and Computer Science and the Computing Center, Washington State University, Pullman, Wash. 99163.
W. H. Payne , Department of Computer Science and the Computing Center, Washington State University, Pullman, Wash. 99163.
pp. 337-345

Pseudonoise with Arbitrary Amplitude Distribution¿Part II: Hardware Implementation (Abstract)

John S. Sobolewski , Departments of Electrical Engineering and Computer Science, and the Computing Center, Washington State University, Pullman, Wash. 99163.
W. H. Payne , Department of Computer Science and the Computing Center, Washington State University, Pullman, Wash. 99163.
pp. 346-352

Correlation Matrix Memories (Abstract)

Teuvo Kohonen , Department of Technical Physics, Helsinki University of Technology, Otaniemi, Finland.
pp. 353-359

Dynamic Memories with Enhanced Data Access (Abstract)

Harold S. Stone , Digital systems Laboratory, Stanford Electronics Laboratories, Stanford University, Stanford, Calif. 94305.
pp. 359-366

A Parallel Implementation of the Fast Fourier Transform Algorithm (Abstract)

G. D. Bergland , Bell Telephone Laboratories, Inc., Whippany, N. J. 07981.
pp. 366-370

Feedback in Sequential Machine Realizations (Abstract)

Clarence L. Coates , Coordinated Science Laboratory and the Department of Electrical Engineering, University of Illinois, Urbana, Ill.
Charles A. Harlow , Department of Electrical Engineering, University of Missouri, Columbia, Mo.
pp. 371-381

Randomized Pattern Search (Abstract)

Kenneth Steiglitz , Department of Electrical Engineering, Princeton University, Princeton, N. J.
J. P. Lawrence , Part-time student in the Department of Electrical Engineering, University of Maryland, College Park, Md.
pp. 382-385

Improved Procedures for Determining Diagnostic Resolution (Abstract)

James C. Bassett , Department of Electrical Engineering, University of Wisconsin, Madison, Wis.
Charles R. Kime , Department of Electrical Engineering, University of Wisconsin, Madison, Wis.
pp. 385-388

Stochastic Automata and the Problems of Reliability in Sequential Machines (Abstract)

Behrooz Parhami , Student in the Department of Computer Science, University of California, Los Angeles, Calif. 90024.
pp. 388-391

Resident-Bubble Cellular Logic Using Magnetic Domains (Abstract)

M. R. Garey , Bell Telephone Laboratories, Inc., Murray Hill, N. J.
pp. 392-396

A Modified Training Procedure for Linear Threshold Devices (Abstract)

D. F. Stanat , Department of Computer Science, University of North Carolina, Chapel Hill, N. C. 27514.
S. K. Das , Systems Development Division, IBM Corporation, Research Triangle Park, N. C.
pp. 396-397

Next-State Equations of Asynchronous Sequential Machines (Abstract)

Gabriele Saucier , Laboratory of Applied Mathematics, University of Grenoble, Grenoble, France.
pp. 397-399

A Note on Three-Valued Logic Simulation (Abstract)

Melvin A. Breuer , Department of Electrical Engineering, University of Southern California, Los Angeles, Calif. 90007.
pp. 399-402

Enumeration of Ternary Threshold Functions of Three Variables (Abstract)

Tsunehiro Aibara , Department of Electrical Engineering, Ehime University, Matsuyama, Japan.
Michihiro Akagi , Electrical Communication Laboratory, Nippon Telegraph and Telephone Corporation, Musashino, Tokyo, Japan.
pp. 402-407

Comments on ``A Minimization Technique for TANT Networks'' (Abstract)

Edward S. Davidson , Digital Systems Laboratory, Stanford Electronics Laboratories, Stanford University, Stanford, Calif.
Hsiao P. Lee , Digital Systems Laboratory, Stanford Electronics Laboratories, Stanford University, Stanford, Calif.
pp. 407

Author's Reply (Abstract)

Kyung Shik Koh , Department of Electrical Engineering, Inha Institute of Technology, Inchon, Korea.
pp. 408

Author's Reply (Abstract)

Subrata K. Das , Systems Development Division, IBM Corporation, Research Triangle Park, N. C. 27709.
pp. 409

Some Inequalities Between Distance Measures for Feature Evaluation (Abstract)

Godfried T. Toussaint , Department of Electrical Engineering, University of British Columbia, Vancouver 8, B. C., Canada.
pp. 409-410

On the Extraction of Pattern Features from Imperfectly Identified Samples (Abstract)

C. Chitti Babu , Department of Electrical Engineering, University of Waterloo, Waterloo, Ont., Canada.
pp. 410-411

Contributors (PDF)

pp. 412-413

Book Reviews (PDF)

pp. 413-414

Descriptor-in-Context Index (PDF)

pp. 426-430

Identifier Index (PDF)

pp. 431-432

Author Index (PDF)

pp. 432

Information for Authors (PDF)

pp. nil2

[Front cover] (PDF)

pp. c2
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