The Community for Technology Leaders
Green Image
Issue No. 04 - April (1972 vol. 21)
ISSN: 0018-9340
pp: 385-388
James C. Bassett , Department of Electrical Engineering, University of Wisconsin, Madison, Wis.
Charles R. Kime , Department of Electrical Engineering, University of Wisconsin, Madison, Wis.
ABSTRACT
The definition of the generalized fault table [1] is expanded to cover a representation employing more than one fault q cube per fault pattern. On the basis of this expanded definition and simple concepts from a cover algebra, a new procedure is developed for finding first- and second-order diagnostic resolutions.
INDEX TERMS
CITATION
James C. Bassett, Charles R. Kime, "Improved Procedures for Determining Diagnostic Resolution", IEEE Transactions on Computers, vol. 21, no. , pp. 385-388, April 1972, doi:10.1109/TC.1972.5008980
90 ms
(Ver 3.1 (10032016))