Issue No. 06 - June (1971 vol. 20)
G.R. Putzolu , IEEE
This paper describes an algorithm for the computation of tests to detect failures in asynchronous sequential logic circuits. It is based upon an extension of the D-algorithm . Discussion of experience with a program of the procedure is given.
Circuit testing, D-algorithm, diagnosis, LSI, simulation, test generation.
J. Roth and G. Putzolu, "A Heuristic Algorithm for the Testing of Asynchronous Circuits," in IEEE Transactions on Computers, vol. 20, no. , pp. 639-647, 1971.