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ABSTRACT
This paper describes an algorithm for the computation of tests to detect failures in asynchronous sequential logic circuits. It is based upon an extension of the D-algorithm [1]. Discussion of experience with a program of the procedure is given.
INDEX TERMS
Circuit testing, D-algorithm, diagnosis, LSI, simulation, test generation.
CITATION

J. Roth and G. Putzolu, "A Heuristic Algorithm for the Testing of Asynchronous Circuits," in IEEE Transactions on Computers, vol. 20, no. , pp. 639-647, 1971.
doi:10.1109/T-C.1971.223315
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