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Issue No. 05 - May (1971 vol. 20)
ISSN: 0018-9340
pp: 524-535
P.R. Menon , IEEE
ABSTRACT
Kautz has studied the problem of testing one-and two-dimensional arrays of combinational cells under the assumptions that all cell inputs must be applied to a cell to test it completely and that a fault in a cell may cause any arbitrary change in its outputs. In this paper we study the same problem under a more restricted set of assumptions: 1) all faults in a cell can be detected by a known set of inputs (usually smaller than the set of all inputs); and 2) each fault will affect the cell outputs in a known manner. Necessary and sufficient conditions for detection of faults in one-dimensional arrays are obtained. A procedure for deriving efficient tests for one-dimensional arrays is presented. Sufficient conditions for the testability of two-dimensional arrays and procedures for constructing tests for some arrays are obtained.
INDEX TERMS
Fault detection, iterative arrays, one-dimensional arrays, test derivation, two-dimensional arrays.
CITATION
P.R. Menon, A.D. Friedman, "Fault Detection in Iterative Logic Arrays", IEEE Transactions on Computers, vol. 20, no. , pp. 524-535, May 1971, doi:10.1109/T-C.1971.223286
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