Issue No. 11 - November (1970 vol. 19)
C.R. Kime , IEEE
A model for the representation of diagnostic test-fault relationships is presented which provides increased flexibility over previous models and is adaptable to handling large-scale integrated systems. Several forms of the model are given and methods for transforming from one form to another are presented. Procedures are given for assessing the diagnostic capability of the test set and theorems are presented which give necessary and sufficient conditions in terms of the model for diagnosability with and without fault repair. Finally, the model is compared to a number of existing models to demonstrate its flexibility.
Diagnostic resolution, digital systems, fault diagnosis, module level diagnosis, multiple faults, switching theory.
C.R. Kime, "An Analysis Model for Digital System Diagnosis", IEEE Transactions on Computers, vol. 19, no. , pp. 1063-1073, November 1970, doi:10.1109/T-C.1970.222833